We are V-Probes Incorporated in Santa Clara, California in 2007, V-Probes Holdings Co., Ltd provides Vertical & Cantilever / Epoxy Probe Card design & manufacturing services to major semiconductor companies around the world. Our Probe Cards are designed using Cobra & a proprietary ‘Pseudo-Vertical’ Cantilever technology. These Probe Cards are used to test Semiconductor wafers, including: System-On-Chip ( SOC ) Devices ASICs & FPGAs Microprocessors & Microcontrollers Graphics Processors Analog & Mixed-signal Devices Custom Applications The V-Probes leadership team is laser focused on supplying outstanding customer service and technical support.  Our Mission is to deliver: V ery High Performance P robe Cards R esulting In O ptimal Quality B efore The Client’s Specified Delivery Date E ach & Every Time With 100% Client S atisfaction We create The best Quality product V-Probes Holdings Co., Ltd delivers high quality Cantilever / Epoxy Probe Cards that average a higher number of “touchdowns”. Cantilever / Epoxy Probe Cards V-Probes Holdings Co., Ltd delivers high quality Cantilever / Epoxy Probe Cards that average a higher number of “touchdowns”. From single to multi-die configurations, V-Probes consistently delivers high probe count Probe Cards within 10 working days. 100% of our projects are tested on our state-of-the-art Probe Card Analyzers and are guaranteed to match the X,Y coordinates supplied with our client’s design input data. Quality is 1 at V-Probes. Our workmanship is guaranteed! Vertical Probe Cards Semiconductor wafer testing has stringent performance requirements. Shrinking geometries, pad pitch, scrub targets, and other issues, including: contact resistance, high/low temperatures, etc., are continually challenging Probe Card manufacturers to adopt new approaches in order to achieve superior performance. V-Probes Holdings Co., Ltd is continually expanding our investment in R&D in order to meet our client’s evolving technical requirements.  As a result, V-Probes consistently delivers high quality Vertical and Cantilever / Epoxy Probe Cards that average a higher number of touchdowns.  The benefit to our clients are significantly reduced wafer test costs. V-Probes Holdings Co., Ltd provides Cobra Vertical Probe Cards. Our Probe Cards provide the following advantages: High-pin densities Easy replacement of probes Balanced contact performance Pitch down to 60 µm Test Temperatures from -20 °C to 160 °C Beam diameter: 2mil, 2.5mil, 3mil, etc. WE MAKE AWESOME Probe Card Analyzer Calibration & Maintenance- Applied Precision’s VX2 & VX3 Precision test equipment requires regular calibration to ensure accurate test results. Regularly scheduled calibration and maintenance of your Probe Card Analyzer will result in a prolonged product life, as well as minimal equipment down-time. Equipment manufacturer, Applied Precision, Inc., recommended at least two major calibration services each year for their VX2 & VX3 Analyzers. V-Probes Holdings Co., Ltd has highly qualified technicians who are currently supporting many of our customers worldwide. Contact V-Probes NOW to schedule your calibration & maintenance services. Replacement Parts for Applied Precision’s VX2 / VX3 /… Probe Card Analyzer parts and accessories are subject to wear & tear, as well as damage due to equipment misapplication. The condition of these parts and accessories can only be diagnosed during a major calibration service. V-Probes can identify and source replacement parts. All parts replacements are fully tested before delivery and installation.